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Degradation of thin poly(lactic acid) films: characterization by capacitance-voltage, atomic force microscopy, scanning electron microscopy and contact-angle measurements

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Author:Sebastian Schusser, S. Menzel, Matthias Bäcker, Marcel Leinhos, Arshak Poghossian, P. Wagner, Michael J. Schöning
ISSN:1873-3859 (E-Journal); 0013-4686 (Print)
Parent Title (English):Electrochimica Acta
Document Type:Article
Language:English
Year of Completion:2013
Date of the Publication (Server):2013/08/26
Volume:Vol. 113
First Page:779
Last Page:784
Link:http://dx.doi.org/10.1016/j.electacta.2013.08.025
Zugriffsart:campus
Institutes:FH Aachen / Fachbereich Medizintechnik und Technomathematik
FH Aachen / INB - Institut für Nano- und Biotechnologien