In-situ compensation of the parasitic capacitance for nanoscale hysteresis measurements / Schmitz, T. ; Prume, K. ; Reichenberg, B. ; Roelofs, A. ; Waser, R. ; Tiedke, S.
Author: | Klaus Prume, B. Reichenberg, A. Roelofs, R. Waser |
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ISBN: | 0955-2219 |
Parent Title (English): | Journal of the European Ceramic Society. 24 (2004), H. 6 |
Document Type: | Article |
Language: | English |
Year of Completion: | 2004 |
First Page: | 1145 |
Last Page: | 1147 |
Note: | Electroceramics VIII |
Link: | http://dx.doi.org/10.1016/S0955-2219(03)00583-1 |
Zugriffsart: | bezahl |
Institutes: | FH Aachen / Fachbereich Elektrotechnik und Informationstechnik |