Degradation of thin poly(lactic acid) films: characterization by capacitance-voltage, atomic force microscopy, scanning electron microscopy and contact-angle measurements
Author: | Sebastian Schusser, S. Menzel, Matthias Bäcker, Marcel Leinhos, Arshak PoghossianORCiD, P. Wagner, Michael Josef SchöningORCiD |
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ISSN: | 1873-3859 (E-Journal); 0013-4686 (Print) |
Parent Title (English): | Electrochimica Acta |
Publisher: | Elsevier |
Place of publication: | Amsterdam |
Document Type: | Article |
Language: | English |
Year of Completion: | 2013 |
Volume: | Vol. 113 |
First Page: | 779 |
Last Page: | 784 |
Link: | http://dx.doi.org/10.1016/j.electacta.2013.08.025 |
Zugriffsart: | campus |
Institutes: | FH Aachen / Fachbereich Medizintechnik und Technomathematik |
FH Aachen / INB - Institut für Nano- und Biotechnologien | |
collections: | Verlag / Elsevier |