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T. Remmele (2)
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Strain determination in mismatched semiconductor heterostructures by the digital analysis of lattice images / A. Rosenauer ; T. Remmele ; U. Fischer ; A. Förster ...
(1997)
Arnold Förster
;
A. Rosenauer
;
T. Remmele
Atomic scale strain measurements by the digital analysis of transmission electron microscopic lattice images / A. Rosenauer ; T. Remmele ; D. Gerthsen ... A. Förster
(1997)
Arnold Förster
;
A. Rosenauer
;
T. Remmele
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