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Author
A. Rosenauer
(6)
Arnold Förster
(6)
D. Gerthsen
(4)
T. Remmele
(2)
U. Fischer
(2)
W. Oberst
(2)
D. Litvinov
(1)
R. Schmidt
(1)
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2000
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Fachbereich Energietechnik
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INB - Institut für Nano- und Biotechnologien
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Structural and Chemical Investigation of In-0.6Ga0.4As Stranski-Krastanow Layers Burried in GaAs by Transmission Electron Microscopy
(2000)
A. Rosenauer
;
W. Oberst
;
D. Litvinov
;
D. Gerthsen
;
Arnold Förster
;
R. Schmidt
Atomic scale analysis of the indium distribution in InGaAs/GaAs (001) heterostructures: segregation, lateral indium redistribution and the effect of growth interruptions. Rosenauer, A. ; Oberst, W. ; Gerthsen, D. ; Förster, A.
(1999)
Arnold Förster
;
A. Rosenauer
;
W. Oberst
;
D. Gerthsen
Composition evaluation by lattice fringe analysis. Rosenauer, A.; Fischer U.; Gerthsen D.; Förster A.
(1998)
Arnold Förster
;
A. Rosenauer
;
U. Fischer
;
D. Gerthsen
Strain determination in mismatched semiconductor heterostructures by the digital analysis of lattice images / A. Rosenauer ; T. Remmele ; U. Fischer ; A. Förster ...
(1997)
Arnold Förster
;
A. Rosenauer
;
T. Remmele
Atomic scale strain measurements by the digital analysis of transmission electron microscopic lattice images / A. Rosenauer ; T. Remmele ; D. Gerthsen ... A. Förster
(1997)
Arnold Förster
;
A. Rosenauer
;
T. Remmele
Composition evaluation of InxGa1 – xAs Stranski-Krastanow-island structures by strain state analysis / A. Rosenauer ; U. Fischer ; D. Gerthsen ; A. Förster
(1997)
Arnold Förster
;
A. Rosenauer
;
U. Fischer
;
D. Gerthsen
1
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6
