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Arnold Förster
(144)
H. Lüth
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Fachbereich Energietechnik (144)
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Title
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Author
The Schottky barrier at the InSb(110)–Sn interface
(1987)
Arnold Förster
;
A. Tulke
;
H. Lüth
Surface reactions of trimethylgallium and trimethylarsenic on silicon surfaces
(1989)
Arnold Förster
;
H. Lüth
Effect of interface roughness and scattering on the performance of AlAs/InGaAs resonant tunneling diodes
(1993)
Arnold Förster
;
J. Lange
;
D. Gerthsen
Strain dependence of the valence-band offset in arsenide compound heterojunctions determined by photoelectron spectroscopy / C. Ohler ; J. Moers ; A. Förster ...
(1993)
Arnold Förster
;
C. Ohler
;
J. Moers
The adsorption of fluor-carbon complexes on GaAs(110) studied by electron energy loss spectroscopy
(1986)
Arnold Förster
;
A. Spitzer
;
H. Lüth
Investigation of the InSb(110)-Sn schottky barrier by means of electron energy loss spectroscopy
(1987)
Arnold Förster
;
H. Lüth
Optimization of III/V binary growth with RHEED in MOMBE / C. Ungermanns ; M. v. d. Ahe ; R. Carius ; A. Förster ...
(1997)
C. Ungermanns
;
M. v. d. Ahe
;
Reinhard Carius
;
Arnold Förster
Pixel X-ray detectors in epitaxial gallium arsenide withhigh-energy resolution capabilities (Fano factor experimentaldetermination) / G. Bertuccio ; A. Pullia ; J. Lauter ; A. Förster ...
(1997)
Arnold Förster
;
G. Bertuccio
;
A. Pullia
On the hopping and band conductivity in molecular-beam epitaxial low-temperature grown GaAs / M. Morvic ; J. Betko ; J. Novák ... A. Förster
(1998)
Arnold Förster
;
M. Morvic
;
J. Betko
High quality GaAs-based resonant tunneling diodes for high frequency device applications / H. Brugger ; U. Meiners ; C. Wölk ... A. Förster ...
(1991)
Arnold Förster
;
H. Brugger
;
U. Meiners
Investigation of deep-level states in bulk and low temperature MBE semiinsulating GaAs by admittance transient spectroscopy / F. Dubecky ; J. Darmo ; M. Darviras ; A. Förster ...
(1994)
Arnold Förster
;
F.. Dubecky
;
J. Darmo
Microstructure of the AlAs/GaAs and AlAs/InGaAs resonant tunneling diodes and its correlation with the electrical properties / C. Dieker ; D. Gerthsen ; A. Förster ...
(1993)
Arnold Förster
;
C. Dieker
;
D. Gerthsen
AlAs/GaAs Quantum well structures: Interface properties investigated by high-resolution transmission electron microscopy and photoluminescence spectroscopy / T. Walther ; D. Gerthsen ; R. Carius ; A. Förster ...
(1993)
T. Walther
;
D. Gerthsen
;
Reinhard Carius
;
Arnold Förster
Electrical and structural characterization of MBE GaAs grown at temperatures between 200 and 600 °C / P. Kordos ; J. Betko; A. Förster ...
(1995)
Arnold Förster
;
P. Kordos
;
J. Betko
Comparative investigation of electrical and optical characteristics of AlxGa1-xAs/GaAs structures deposited by LP-MOVPE and MBE / H. Hardtdegen ; M. Hollfelder ; C. Ungermanns ... A. Förster ...
(1995)
Arnold Förster
;
Hilde Hardtdegen
;
C. Ungermanns
Morphological transformations of MBE-grown In0.6Ga0.4As island on GaAs(001) substrates / K. Tillmann ; D. Gerthsen ; P. Pfundstein ; A. Förster ...
(1995)
Arnold Förster
;
K. Tillmann
;
D. Gerthsen
AlGaAs/GaAs avalanche detector array -1 GBit/s X-ray receiver for timing measurements / J. Lauter ; A. Förster ; H. Lüth ...
(1996)
Arnold Förster
;
J. Lauter
;
H. Lüth
Strain relaxation of lattice-mismatched In0.2Ga0.8As/GaAs superlattices on GaAs(001) substrates / M. Lentzen ; D. Gerthsen ; A. Förster ...
(1995)
Arnold Förster
;
M. Lentzen
;
D. Gerthsen
Depth resolved investigations of the relaxation behaviour in strained GaInAs/GaAs superlattices using grazing incidence X-ray diffraction / Rose, D. ; Pietsch, U. ; Förster, A. ; Metzger, T. H.
(1995)
Arnold Förster
;
D. Rose
;
U. Pietsch
;
T. H. Metzger
Strain determination in mismatched semiconductor heterostructures by the digital analysis of lattice images / A. Rosenauer ; T. Remmele ; U. Fischer ; A. Förster ...
(1997)
Arnold Förster
;
A. Rosenauer
;
T. Remmele
101
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