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Arnold Förster (144)
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Biosensor
(1)
GaAs hot electron injector
(1)
Gunn diode
(1)
microwave generation
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Fachbereich Energietechnik
(142)
INB - Institut für Nano- und Biotechnologien
(25)
Fachbereich Medizintechnik und Technomathematik
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Fachbereich Chemie und Biotechnologie
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144
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Title
Title
Author
Author
The effect of inhomogeneous dopant profiles on the electron energy loss spectra of Si(100) /
(1988)
Arnold Förster
;
J. M. Layet
;
H. Lüth
The effect of growth temperature on AlAs/GaAs resonant tunnelling diodes
(1994)
Arnold Förster
;
J. Lange
;
D. Gerthsen
The adsorption of fluor-carbon complexes on GaAs(110) studied by electron energy loss spectroscopy
(1986)
Arnold Förster
;
A. Spitzer
;
H. Lüth
Surface reactions of trimethylgallium and trimethylarsenic on silicon surfaces
(1989)
Arnold Förster
;
H. Lüth
Supression of the surface-inversion layer of p-type InAs. Lachenmann, S. G.; Fridrich, I.; Förster, A.; Schäpers, Th.
(1999)
Arnold Förster
;
S. G. Lachenmann
;
I. Fridrich
;
T. Schäpers
Superconductor/semiconductor step junctions: the basic element for hybrid three terminal devices. Lachenmann, S. G., Förster, A.; Friedrich, I.; Uhlisch, D.; Schäpers, Th.; Kastalsky, A.; Golubov, A. A.
(1999)
Arnold Förster
;
S. G. Lachenmann
;
I. Friedrich
;
D. Uhlisch
Subpicosecond coherent carrier-phonon dynamics in semiconductor heterostructures / T. Dekorsy ; A. M. T. Kim ; G. C. Cho ... A. Förster
(1996)
Arnold Förster
;
T. Dekorsy
;
A. T. M. Kim
Study of d-doped GaAs layers by micro-Raman spectroscopy on bevelled samples
(2004)
R. Srnanek
;
J. Geurts
;
M. Lentze
;
G. Irmer
;
D. Donoval
;
P. Brdecka
;
P. Kordos
;
Arnold Förster
;
B. Sciana
;
D. Radziewicz
;
M. Tlaczala
Structural transformations and strain relaxation mechanisms of In0.6Ga0.4As islands grown by molecular beam epitaxy on GaAs(001) substrates / Tillmann, K. ; Gerthsen, D. ; Pfundstein, P. ; Förster, A. ; Urban, K.
(1995)
Arnold Förster
;
K. Tillmann
;
D. Gerthsen
;
P. Pfundstein
Structural and Chemical Investigation of In-0.6Ga0.4As Stranski-Krastanow Layers Burried in GaAs by Transmission Electron Microscopy
(2000)
A. Rosenauer
;
W. Oberst
;
D. Litvinov
;
D. Gerthsen
;
Arnold Förster
;
R. Schmidt
15
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24