Deutsch
Login
Open Access
Home
Search
Browse
Administration
FAQ
Refine
Author
T. Remmele (2)
(remove)
2
search hits
1
to
2
Export
BibTeX
CSV
RIS
10
10
20
50
100
Sort by
Year
Year
Title
Title
Author
Author
Atomic scale strain measurements by the digital analysis of transmission electron microscopic lattice images / A. Rosenauer ; T. Remmele ; D. Gerthsen ... A. Förster
(1997)
Arnold Förster
;
A. Rosenauer
;
T. Remmele
Strain determination in mismatched semiconductor heterostructures by the digital analysis of lattice images / A. Rosenauer ; T. Remmele ; U. Fischer ; A. Förster ...
(1997)
Arnold Förster
;
A. Rosenauer
;
T. Remmele
1
to
2