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Visualization of the recovery process of defects in a cultured cell layer by chemical imaging sensor

  • The chemical imaging sensor is a field-effect sensor which is able to visualize both the distribution of ions (in LAPS mode) and the distribution of impedance (in SPIM mode) in the sample. In this study, a novel cell assay is proposed, in which the chemical imaging sensor operated in SPIM mode is applied to monitor the recovery of defects in a cell layer brought into proximity of the sensing surface. A reduced impedance at a defect formed artificially in a cell layer was successfully visualized in a photocurrent image. The cell layer was cultured over two weeks, during which the temporal change of the photocurrent distribution corresponding to the recovery of the defect was observed.

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Metadaten
Verfasserangaben:Ko-ichiro Miyamoto, Bing Yu, Hiroko Isoda, Torsten WagnerORCiD, Michael Josef SchöningORCiD, Tatsuo Yoshinobu
DOI:https://doi.org/10.1016/j.snb.2016.04.018
ISSN:0925-4005
Titel des übergeordneten Werkes (Deutsch):Sensors and Actuators B: Chemical
Verlag:Elsevier
Verlagsort:Amsterdam
Dokumentart:Wissenschaftlicher Artikel
Sprache:Deutsch
Erscheinungsjahr:2016
Datum der Publikation (Server):18.04.2016
Jahrgang:236
Erste Seite:965
Letzte Seite:969
Link:https://doi.org/10.1016/j.snb.2016.04.018
Zugriffsart:bezahl
Fachbereiche und Einrichtungen:FH Aachen / Fachbereich Medizintechnik und Technomathematik
FH Aachen / INB - Institut für Nano- und Biotechnologien
collections:Verlag / Elsevier